1.

Conference Proceedings

Conference Proceedings
Lavenier,D. ; Fabiani,E. ; Derrien,S. ; Wagner,C.
Pub. info.: Imaging spectrometry VII : 1-3 August 2001, San Diego, USA.  pp.130-138,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4480
2.

Conference Proceedings

Conference Proceedings
Flagello,D.G. ; Mulkens,I. ; Wagner,C.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.172-183,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
3.

Conference Proceedings

Conference Proceedings
Wagner,C. ; Kaiser,W.M. ; Mulkens,I. ; Flagello,D.G.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.344-357,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000