1.

Conference Proceedings
Conference Proceedings
1. Low Temperature Deposition of Polycrystalline Lithium Transition Metal Oxide Thin Films for Micro Batteries
K. Chiu ; C. Chen ; P. Chen ; W. Ho
Pub. info.: Micro Power Sources.  pp.1-9,  2009.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(26)
2.

Technical Paper
Technical Paper
2. A Review of Ablation Modeling for Thermal Protection Systems
J. Koo ; W. Ho ; O. Ezekoye
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2006
3.

Technical Paper
Technical Paper
3. A Review of Numerical and Experimental Characterization of Thermal Protection Materials Part II: Properties Characterization
J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 2007
4.

Technical Paper
Technical Paper
4. Experimental Characterization of Thermoplastic Polyurethane Nanocomposite under Extreme Conditions
K. Nguyen ; J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2007
5.

Technical Paper
Technical Paper
5. A Review of Numerical and Experimental Characterization of Thermal Protection Materials: Part III - Material Testing
J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2007
6.

Conference Proceedings
Conference Proceedings
6. Real-time spatial control of photoresist development rate
A. Tay ; W. Ho ; N. Hu ; C. Kiew ; K. Tsai
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518