1.

Conference Proceedings
Conference Proceedings
1. Chemical and Structural Characterization of Oxide Precipitates in Heavily Boron Doped Silicon by Infrared Spectroscopy and Transmission Electron Microscopy
Gryse, O. De ; Clauws, P. ; Vanhellemont, J. ; Lebedev, O. ; Van Landuyt, J. ; Simoen, E. ; Claeys, C.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.183-196,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
2.

Conference Proceedings
Conference Proceedings
2. On the Nucleation and Growth of Bulk Stacking Faults in Cz Silicon
Vanhellemont, J. ; De Gryse, O. ; Clauws, P.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.91-104,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20