1.

Conference Proceedings

Conference Proceedings
Pophristic, M. ; Long, F. H. ; Tran, C. ; Ferguson, I. T.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.58.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
2.

Conference Proceedings

Conference Proceedings
Ranney, K. ; Tran, C.
Pub. info.: Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA.  pp.447-458,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5794
3.

Conference Proceedings

Conference Proceedings
Kim, Y. D. ; Kang, H. B. ; Zhang, Y. ; Tran, C. ; Farrar, N. ; Qin, J. ; Rockwell, B. ; Cho, H. J. ; Cottle, R. ; Chan, D. ; Martin, P. ; Choi, S. S. ; Progler, C.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.1586-1590,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
4.

Conference Proceedings

Conference Proceedings
Pophristic, M. ; Long, F. H. ; Tran, C. ; Ferguson, I. T.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1623-1626,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
5.

Conference Proceedings

Conference Proceedings
Kirose, G. ; Ranney, K.I. ; Tran, C.
Pub. info.: Radar sensor technology and data visualization : 1 April and 4 April 2002, Orlando, USA.  pp.125-136,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4744