1.

Conference Proceedings

Conference Proceedings
Sakamoto,K. ; Takahashi,H. ; Shimizu,E. ; Yamasaki,K. ; Ando,T. ; Okamoto,M.
Pub. info.: Sixth International Symposium on Display Holography, 21-25 July 1997, Lake Forest, Illinois.  pp.232-238,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3358
2.

Conference Proceedings

Conference Proceedings
Nagashige,S. ; Hayashi,K. ; Akima,S. ; Takahashi,H. ; Chiba,K. ; Yamada,Y. ; Matsuzawa,Y.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part1  pp.127-137,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
3.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.155-160,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
4.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Kato,T.
Pub. info.: Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992.  pp.197-200,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 126-128
5.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Fujiwara,K. ; Seo,M.
Pub. info.: Passivation of metals and semiconductors : proceedings of the Seventh International Symposium on Passivity, Passivation of Metals and Semiconductors, Technical University of Clausthal, Germany, August 21-26, 1994.  pp.1001-1010,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 185-188
6.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1257-1262,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Sakaguchi,N. ; Hashimoto,N. ; Watanabe,S.
Pub. info.: Intergranular and interphase boundaries in materials : iib95 : proceedings of the 7th International Conference on Intergranular and Interphase Boundaries in Materials held in Lisboa, Portugal, June 26-29, 1995.  pp.561-564,  1996.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 207-209
8.

Conference Proceedings

Conference Proceedings
Kurokawa,K. ; Matsuoka,H. ; Takahashi,H.
Pub. info.: High temperature corrosion and protection of materials 4 : proceedings of the 4th International Symposium on High Temperature Corrosion and Protection of Materials = Actes du 4è Colloque International sur la Corrosion et la Protection des Matériaux à haute Température, Les Embiez, France, May-mai 20-24 1996.  Part2  pp.885-892,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 251-254
9.

Conference Proceedings

Conference Proceedings
Suemitsu,M. ; Takahashi,H. ; Sagae,Y. ; Miyamoto,N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1037-1042,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
10.

Conference Proceedings

Conference Proceedings
Kong,W.M. ; Takahashi,H. ; Nakajima,M.
Pub. info.: Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado.  pp.303-311,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2847