Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Arai, K. ; Kimura, K. ; Nakamura, K. ; Yoshida, S.
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Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.211-214, 2006. Stafa-Zuerich. Trans Tech Publications
Kitaguchi, T. ; Kokubun, M. ; Kawaharada, M. ; Murashima, M. ; Miyawaki, R. ; Yanagida, T. ; Itoh, T. ; Hirakuri, S. ; Enoto, T. ; Sato, M. ; Makishima, K. ; Takahashi, T. ; Nakazawa, K. ; Watanabe, S. ; Tanaka, T.
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Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA. pp.63190U-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.62660D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information. pp.62521M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kunieda, H. ; Mitsuda, K. ; Takahashi, T. ; Kelley, R. ; White, N.
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Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.626605-626605, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Takahashi, T. ; Saito, S. ; Okumura, T. ; Suzuki, E. ; Kojima, T. ; Motomiya, S. ; Maruyama, H. ; Suzuki, H. ; Machida, K. ; Tojo, T.
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61523P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yamaoka, K. ; Sugita, S. ; Ohno, M. ; Takahashi, T. ; Fukazawa, Y. ; Terada, Y. ; Tamagawa, T ; Abe, K. ; Endo, Y. ; Onda, K. ; Matsumura, S. ; Tashiro, M. ; Soojing, H. ; Sato, G. ; Nakazawa, K.
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Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.626643-626643, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Parmar, A. N. ; Armaud, M. ; Barcons, X. ; Bleeker, J. ; Hasinger, G. ; Kunieda, H. ; Palumbo, G. ; Takahashi, T. ; Turner, M. ; de Korte, P. ; Willingale, R. ; Rando, N. ; Lyngvi, A. ; Gondoin, P. ; Lumb, D.
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Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.62661R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nakazawa, K. ; Fukazawa, Y. ; Kamae, T. ; Kataoka, J. ; Kokubun, M. ; Makishima, K. ; Mizuno, T. ; Murakami, T. ; Nomachi, M. ; Tajima, H. ; Takahashi, T. ; Tashiro, M. ; Tamagawa. T ; Terada, Y. ; Watanabe, S.
Pub. info.:
Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.62662H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering