1.

Conference Proceedings
Conference Proceedings
1. Proposal of the Thermal Equilibrium Model for SiC Hydrogen Etching Phenomena
Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Arai, K. ; Kimura, K. ; Nakamura, K. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.211-214,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
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Conference Proceedings
Conference Proceedings
2. Results of a Si/cdTe Compton Telescope [5922-18]
Oonuki, K. ; Tanaka, T. ; Watanabe, S. ; Takeda, S. ; Nakazawa, K. ; Mitani, T. ; Takahashi, T. ; Tajima, H. ; Fukazawa, Y. ; Nomachi, M.
Pub. info.: Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California.  pp.59220J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5922
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Conference Proceedings
Conference Proceedings
3. Phase-shifting joint transform correlator with a wavelength-shifted laser diode (Invited Paper)
Takahashi, T. ; Ishii, Y.
Pub. info.: Optical information processing technology : 16-18 October 2002, Shanghai, China.  pp.254-266,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4929
4.

Conference Proceedings
Conference Proceedings
4. Temperature measurement of ceramics in furnaces by 3-color thermograph
Takahashi, T. ; Hashimoto, M. ; Yano, K. ; Tamura, T. ; Iwata, M. ; Kitagawa, K. ; Arai, N.
Pub. info.: Thermosense XXIV : 1-4 April 2002, Orlando, [Florida] USA.  pp.72-79,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4710
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Conference Proceedings
Conference Proceedings
5. Gamma-ray polarimetry with Compton Telescope
Tajima, H. ; Madejski, G. ; Mitani, T. ; Tanaka, T. ; Nakamura, H. ; Nakazawa, K. ; Takahashi, T. ; Fukazawa, Y. ; Kamae, T. ; Kokubun, M. ; Marlow, D. ; Nomachi, M. ; Silva, E. do Covto e
Pub. info.: UV and gamma-ray space telescope systems : 21-24 June 2004, Glasgow, Scotland, United Kingdom.  pp.561-571,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5488
6.

Conference Proceedings
Conference Proceedings
6. Wide band X-ray Imager (WXI) and Soft Gamma-ray Detector (SGD) for the NeXT mission
Takahashi, T. ; Awaki, A. ; Dotani, T. ; Fukazawa, Y. ; Hayashida, K. ; Kamae, T. ; Kataoka, J. ; Kawai, N. ; Kitamoto, S. ; Kohmura, T. ; Kokubun, M. ; Koyama, K. ; Makishima, K. ; Matsumoto, H. ; Miyata, E. ; Murakami, T. ; Nakazawa, K. ; Nomachi, M. ; Ozaki, M. ; Tajima, H. ; Tashiro, M. ; Tamagawa, T. ; Terada, Y. ; Tsunemi, H. ; Tsuru, T. ; Yamaoka, K. ; Yonetoku, D. ; Yoshida, A.
Pub. info.: UV and gamma-ray space telescope systems : 21-24 June 2004, Glasgow, Scotland, United Kingdom.  pp.549-,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5488
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Conference Proceedings
Conference Proceedings
7. Study of the Automatic Modeling of Reaction Systems for Chemical Vapor Deposition Processes Using Genetic Algorithms
Takahashi, T. ; Funatsu, K. ; Ema, Y.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.272-278,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
8.

Conference Proceedings
Conference Proceedings
8. Swift/BAT calibration and the estimated BAT hard x-ray survey sensitivity
Parsons, A.M. ; Tueller, J. ; Krimm, H. ; Barthelmy, S.D. ; Cummings, J. ; Markwardt, C. ; Hullinger, D. ; Gehrels, N. ; Fenimore, E. ; Palmer, D. ; Sato, G. ; Nakazawa, K. ; Takahashi, T. ; Watanabe, S. ; Okada, Y. ; Takahashi, H. ; Suzuki, M. ; Tashiro, M.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.190-200,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5165
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Conference Proceedings
Conference Proceedings
9. The XEUS hard x-ray camera
Budtz-Jorgensen, C. ; Takahashi, T. ; Piro, L. ; Kuvvetli, I. ; Holland, A.D. ; Lumb, D.H. ; Korte, P.A.J.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.37-44,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5165
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Conference Proceedings
Conference Proceedings
10. Creating photorealistic virtual model with polarization-based vison system [5888-04]
Shibata, T. ; Takahashi, T. ; Miyazaki, D. ; Sato, Y. ; Ikeuchi, K.
Pub. info.: Polarization science and remote sensing II : 2-4 August 2005, San Diego, California, USA.  pp.588804-588804,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5888
11.

Conference Proceedings
Conference Proceedings
11. In-orbit calibration of the hard x-ray detector (HXD-II) onboard Suzaku [6319A-28]
Kitaguchi, T. ; Kokubun, M. ; Kawaharada, M. ; Murashima, M. ; Miyawaki, R. ; Yanagida, T. ; Itoh, T. ; Hirakuri, S. ; Enoto, T. ; Sato, M. ; Makishima, K. ; Takahashi, T. ; Nakazawa, K. ; Watanabe, S. ; Tanaka, T.
Pub. info.: Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA.  pp.63190U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6319
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Conference Proceedings
Conference Proceedings
12. ES-irradiation induced intelligent properties of polymers
Takahashi, T. ; Oguri, K. ; Tonegawa, A. ; Nishi, Y.
Pub. info.: Smart materials III : 13-15 December 2004, Sydney, Australia.  pp.345-350,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5648
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Conference Proceedings
Conference Proceedings
13. Sensitive Detection of Defects in α and β SiC by Raman Scattering
Nakashima, S. ; Nakatake, Y. ; Ishida, Y. ; Takahashi, T. ; Okumura, H.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.629-632,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
14. Replication of Defects from 4H-SiC Wafer to Epitaxial Layer
Ohno, T. ; Yamaguchi, H. ; Kojima, K. ; Nishio, J. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.447-450,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
15. Influence of the Crystalline Quality of Epitaxial Layers on Inversion Channel Mobility in 4H-SiC MOSFETs
Kojima, K. ; Ohno, T. ; Suzuki, S. ; Senzaki, J. ; Harada, S. ; Fukuda, K. ; Kushibe, M. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1053-1056,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
16. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements
Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Jikimoto, T. ; Tsuchida, H. ; Yoshikawa, M. ; Tomioka, Y. ; Midorikawa, M. ; Hijikata, Y. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1013-1016,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
17. Development of an Si/CdTe semiconductor Compton telescope
Tanaka, T. ; Mitani, T. ; Watanabe, S. ; Nakazawa, K. ; Oonuki, K. ; Sato, G. ; Takahashi, T. ; Tamura, K. ; Tajima, H. ; Nakamura, H. ; Nomachi, M. ; Nakamoto, T. ; Fukazawa, Y.
Pub. info.: High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom.  pp.229-240,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5501
18.

Conference Proceedings
Conference Proceedings
18. Development and qualification of the HXD-II onboard Astro-E2
Kawaharada, M. ; Hong, S. ; Murashima, M. M. ; Kokubun, M. ; Itoh, T. ; Makishima, K. ; Miyawaki, R. ; Niko, H. ; Yanagida, T. ; Mitani, T. ; Nakazawa, K. ; Oonuki, K. ; Takahashi, T. ; Tamura, K. ; Tanaka, T. ; Terada, Y. ; Fukazawa, Y. ; Kawano, N. ; Kawashima, K. ; Ohno, M. ; Yamaoka, K. ; Abe, K. ; Suzuki, M. ; Tashiro, M. ; Yonetoku, D. ; Murakami, T.
Pub. info.: High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom.  pp.286-295,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5501
19.

Conference Proceedings
Conference Proceedings
19. Development of uniform CdTe pixel detectors based on Caltech ASIC
Oonuki, K. ; Inoue, H. ; Nakazawa, K. ; Mitani, T. ; Tanaka, T. ; Takahashi, T. ; Chen, C. M. H. ; Cook, W. R. ; Harrison, F. A.
Pub. info.: High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom.  pp.218-228,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5501
20.

Conference Proceedings
Conference Proceedings
20. Low-noise double-sided silicon strip detector for soft gamma-ray Compton camera
Fukazawa, Y. ; Nakamoto, T. ; Sawamoto, N. ; Uno, S. ; Ohsugi, T. ; Tajima, H. ; Takahashi, T. ; Mitani, T. ; Tanaka, T. ; Nakazawa, K.
Pub. info.: High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom.  pp.197-207,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5501
21.

Conference Proceedings
Conference Proceedings
21. Wavelength-shifting phase-conjugate interferometry for distance measurements with an external-cavity laser diode
Maki, H. ; Takahashi, T. ; Ishii, Y.
Pub. info.: Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China.  pp.603-609,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5633
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Conference Proceedings
Conference Proceedings
22. Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique
Higashi, M. ; Takahashi, T. ; Onodera, R. ; Ishii, Y.
Pub. info.: Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China.  pp.598-602,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5633
23.

Conference Proceedings
Conference Proceedings
23. Properties of CdZnTe detectors in the Burst Alert Telescope (BAT) array
Sato, G. ; Takahashi, T. ; Nakazawa, K. ; Watanabe, S. ; Tashiro, M. ; Suzuki, M. ; Okada, Y. ; Takahashi, H. ; Parsons, A. M. ; Tueller, J. ; Krimm, H. ; Barthelmy, S. D. ; Cummings, J. ; Markwardt, C. ; Hullinger, D. D. ; Gehrels, N. A. ; Fenimore, E. E. ; Palmer, D. ; Dean, A. J. ; Willis, D.
Pub. info.: Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California.  pp.209-216,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5198
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Conference Proceedings
Conference Proceedings
24. High Strength Galvanized Wire for Bridge Cables
Tarui, T. ; Konno, S. ; Takahashi, T.
Pub. info.: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.829-834,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 426-432
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Conference Proceedings
Conference Proceedings
25. Global wavefront reconstruction algorithm from its image in the focal plane and Shack- Hartmann sensor images
Takahashi, T. ; Takajo, H. ; Maeyama, T. ; Fujisaki, T.
Pub. info.: Adaptive optics and and applications II : 15-16 October 2002 Shanghai, China.  pp.235-242,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4926
26.

Conference Proceedings
Conference Proceedings
26. Tensile and Bending Behavior of Melt Growth Al2O3/YAG Composite at Ultra High Temperatures (1773-2023K)
Ochiai, S. ; Sakai, Y. ; Sato, K. ; Ueda, T. ; Morishita, K. ; Okuda, H. ; Tanaka, M. ; Hojo, M. ; Waku, Y. ; Nakagawa, N. ; Sakata, S. ; Mitani, A. ; Takahashi, T.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.1091-1096,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(2)
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Conference Proceedings
Conference Proceedings
27. Elaboration on the automatic modelling system for reaction mechanism using a novel calculation method
Takahashi, T. ; Takahashi, K. ; Ema, Y.
Pub. info.: EUROCVD-15, fifteenth European Conference on Chemical Vapor Deposition : proceedings of the international symposium.  pp.21-28,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-09
28.

Conference Proceedings
Conference Proceedings
28. 27-P-16 - Effect of oxygen concentration on catalyst deactivation rate in vapor phase Beckmann rearrangement over acid catalysts
Takahashi, T. ; Kai, T.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.368-368,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
29.

Conference Proceedings
Conference Proceedings
29. Effects of Hydrogen Pressure and H2/Oil Ratio on Deactivation of Atmospheric Residue Hydrotreating Catalysts at Early Process Time
Higashi, H. ; Takahashi, T. ; Kai, T.
Pub. info.: Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002.  pp.339-342,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 145
30.

Conference Proceedings
Conference Proceedings
30. Competitive Growth between Deposition and Etching in 4H-SiC CVD Epitaxy Using Quasi-Hot Wall Reactor
Kushibe, M. ; Ishida, Y. ; Okumura, H. ; Takahashi, T. ; Masahara, K. ; Ohno, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.169-172,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
31.

Conference Proceedings
Conference Proceedings
31. Pre-Growth Treatment of 4H-SiC Substrates by Hydrogen Etching at Low Pressure
Masahara, K. ; Ishida, Y. ; Okumura, H. ; Takahashi, T. ; Kushibe, M. ; Ohno, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1037-1040,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
32.

Conference Proceedings
Conference Proceedings
32. Schottky Barrier Characteristics of 3C-SiC Epilayers Grown by Low Pressure Chemical Vapor Deposition
Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Sekigawa, T. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1235-1238,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
33.

Conference Proceedings
Conference Proceedings
33. The APD Annihilation Mechanism of 3C-SiC Hetero-Epilayer on Si(001) Substrate
Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Sekigawa, T. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.253-256,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
34.

Conference Proceedings
Conference Proceedings
34. Influence of Stacking Faults on the I-V Characteristics of 4H-SiC Schottky Barrier Diodes Fabricated on the (11-20) Face
Kojima, K. ; Ohno, T. ; Fujimoto, T. ; Katsuno, M. ; Ohtani, N. ; Nishio, J. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.925-928,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
35.

Conference Proceedings
Conference Proceedings
35. Epitaxial Growth of (11-20) 4H-SiC Using Substrate Grown in the [11-20] Direction
Kojima, K. ; Ohno, T. ; Senzaki, J. ; Fukuda, K. ; Fujimoto, T. ; Katsuno, M. ; Ohtani, N. ; Nishino, J. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.195-198,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
36.

Conference Proceedings
Conference Proceedings
36. Simulation of High-Temperature SiC Epitaxial Growth Using Vertical, Quasi-Hot-Wall CVD Reactor
Hasegawa, M. ; Miyauchi, A. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Ohno, T. ; Nishio, J. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.227-230,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
37.

Conference Proceedings
Conference Proceedings
37. Investigation of Residual Impurities in 4H-SiC Epitaxial Layers Grown by Hot-Wall Chemical Vapor Deposition
Nishio, J. ; Kushibe, M. ; Masahara, K. ; Kojima, K. ; Ohno, T. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.215-218,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
38.

Conference Proceedings
Conference Proceedings
38. High-Rate Epitaxial Growth of 4H-SiC Using a Vertical-Type, Quasi-Hot-Wall CVD Reactor
Masahara, K. ; Takahashi, T. ; Kushibe, M. ; Ohno, T. ; Nishio, J. ; Kojima, K. ; Ishida, Y. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.179-182,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
39.

Conference Proceedings
Conference Proceedings
39. Propulsive Impulse Generation Using CO2 TEA Lasers
Sasoh, A. ; Watanabe, K. ; Yu, X. ; Ohtani, T. ; Takahashi, T. ; Kawahara, T. ; Ogawa, T.
Pub. info.: Explosion, shock wave and hypervelocity phenomena in materials : proceedings of the 1st International Symposium on Explosion, Shock Wave and Hypervelocity Phenomena in Materials(ESHP Symposium), 15-17 March 2004, Kumamoto, Japan.  pp.139-142,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 465-466
40.

Conference Proceedings
Conference Proceedings
40. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements
Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Jikimoto, T. ; Tsuchida, H. ; Yoshikawa, M. ; Tomioka, Y. ; Midorikawa, M. ; Hijikata, Y. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1013-1016,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
41.

Conference Proceedings
Conference Proceedings
41. Influence of the Crystalline Quality of Epitaxial Layers on Inversion Channel Mobility in 4H-SiC MOSFETs
Kojima, K. ; Ohno, T. ; Suzuki, S. ; Senzaki, J. ; Harada, S. ; Fukuda, K. ; Kushibe, M. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1053-1056,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
42.

Conference Proceedings
Conference Proceedings
42. Control of Lamellar Arrangement in TiAl Intermetallic Compound by Mechanical and Thermal Processes
Fukutomi, H. ; Park, K. S. ; Iseki, T. ; Takahashi, T.
Pub. info.: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.1703-1708,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 426-432
43.

Conference Proceedings
Conference Proceedings
43. Relationship between the Current Direction in the Inversion Layer and the Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors on 3C-SiC
Ohshima, T. ; Lee, K.K. ; Ishida, Y. ; Kojima, K. ; Tanaka, Y. ; Takahashi, T. ; Yoshikawa, M. ; Okumura, H. ; Arai, K. ; Kamiya, T.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1405-1408,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
44.

Conference Proceedings
Conference Proceedings
44. Comparative Study of Heteroepitaxially and Homoepitaxially Grown 3C-SiC Films
Takahashi, T. ; Ishida, Y. ; Tsuchida, H. ; Kamata, I. ; Okumura, H. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.323-326,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
45.

Conference Proceedings
Conference Proceedings
45. 3C-SiC(100) Homoepitaxial Growth by Chemical Vapor Deposition and Schottky Barrier Junction Characteristics
Ishida, Y. ; Kushibe, M. ; Takahashi, T. ; Okumura, H. ; Yoshida, S.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.275-278,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
46.

Conference Proceedings
Conference Proceedings
46. Photoluminescence Mapping of a SiC Wafer in Device Processing
Tajima, M. ; Sugahara, T. ; Hoshino, N. ; Tanimoto, S. ; Takahashi, T. ; Nakashima, S. ; Yamamoto, T.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.569-572,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
47.

Conference Proceedings
Conference Proceedings
47. 4-6. Tsunami Hazards Associated With Explosion- Collapse Processes of a Dome Complex on Minoan Thera
Minoura, K. ; Imamura, F. ; Kuran, U. ; Nakamura, T. ; Papadopoulos, G.A. ; Takahashi, T. ; Yalciner, A.C.
Pub. info.: Submarine landslides and tsunamis.  pp.229-236,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 4, Earth and environmental sciences
Ser. no.: 21
48.

Conference Proceedings
Conference Proceedings
48. Control of Surface Morphologies for Epitaxial Growth on Low Off-Angle 4H-SiC (0001) Substrates
Masahara, K. ; Kushibe, M. ; Ohno, H. ; Kojima, K. ; Takahashi, T. ; Ishida, Y. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.135-138,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
49.

Conference Proceedings
Conference Proceedings
49. Simulation of High-Temperature SiC Epitaxial Growth Using Vertical, Quasi-Hot-Wall CVD Reactor
Hasegawa, M. ; Miyauchi, A. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Ohno, T. ; Nishio, J. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.227-230,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
50.

Conference Proceedings
Conference Proceedings
50. Investigation of Residual Impurities in 4H-SiC Epitaxial Layers Grown by Hot-Wall Chemical Vapor Deposition
Nishio, J. ; Kushibe, M. ; Masahara, K. ; Kojima, K. ; Ohno, T. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Tanaka, T. ; Yoshida, S. ; Arai, K.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.215-218,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393