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20 results

Conference Proceedings

1. Detection of DNA π-Stack Lesions Using Scanning Electrochemical Microscopy

W. Hammond ; J. Arndt ; T. Nguyen ; K. Slowinska ; C. Jackson

Pub. info.:	Biological Nanostructures, Materials, and Applications. pp.55-62, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(38)

Conference Proceedings

2. Multiple Defect Modes in Diamond Photonic Crystal

M. Thitsa ; T. Nguyen ; S. Albin

Pub. info.:	Solid State (General) - 214th ECS Meeting/PRiME 2008. pp.71-77, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(40)

Conference Proceedings

3. Influence of the Synthetic Procedures on the Optoelectronic Properties of CdSe Nanodots

U. Farva ; Y. Na ; Y. Kim ; D. Kim ; T. Nguyen

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.183-186, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

4. Influence of Annealing Treatments on the Morphology and Electrical Properties of GeOI Substrates Obtained by Ge Condensation

J. Damlencourt ; Y. Campidelli ; T. Nguyen ; B. Vincent ; C. Le Royer ; Y. Morand ; S. Cristoloveanu ; L. Clavelier

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment. pp.65-72, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(1)

Conference Proceedings

5. Composite-copper, low-thermal-resistance heat sinks for laser-diode bars, mini-bars and single-emitter devices

R. Miller ; D. Liu ; M. Horsinka ; T. Nguyen ; K. Kuppuswamy

Pub. info.:	High-power diode laser technology and applications VI : 21-23 January 2008, San Jose, California, USA. pp.687607-1-687607-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6876

Conference Proceedings

6. High Hole Mobility SGOI Substrates Obtained by the Germanium Condensation Technique

L. Souriau ; T. Nguyen ; E. Augendre ; R. Loo ; V. Terzieva

Pub. info.:	SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices. pp.79-89, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(10)

Conference Proceedings

7. Epitaxial Regrowth of Ge on SGOI and GeOI Su,bstrates Obtained by Ge Condensation

J. Damlencourt ; Y. Campidelli ; M. Roure ; B. Vincent ; E. Martinez ; F. Fillot ; B. Arrazat ; T. Nguyen ; S. Cristoloveanu ; L. Clavelier ; Y. Morand

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.315-320, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

Conference Proceedings

8. Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs

T. V. Chandrasekhar Rao ; S. Cristoloveanu ; J. Antoszewski ; T. Nguyen ; H. Hovel ; P. Genlil ; L. Faraone

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.279-286, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

Conference Proceedings

9. Origin of Transient Gate Current Observed in Pseudo-MOS Transistor

S. Sato ; T. Nguyen ; S. Cristoloveanu ; Y. Omura

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.95-100, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

10.

Conference Proceedings

10. Tuning the Electrostatic Properties of Silicon-on-Insulating Multilayer (SOIM) Structures

M. Kostrzewa ; T. Nguyen ; J. Mazellier ; C. Deguet ; L. Clavelier

Pub. info.:	Semiconductor Wafer Bonding 10: Science, Technology, and Applications. pp.187-194, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(8)

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