1.

Conference Proceedings
Conference Proceedings
1. Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy
Burton, J.C. ; Sun, L. ; Pophristic, M. ; Lukacs, S. ; Cohen, S. ; Long, F.H. ; Liang, S. ; Lu, Y. ; Feng, Z.C. ; Li, Y. ; Tran, C.
Pub. info.: Proceedings of the Second Symposium on III-V Nitride Materials and Processes.  pp.220-227,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-34
2.

Conference Proceedings
Conference Proceedings
2. Laser-Assisted Molecular-Beam Deposition of Si, C, and SiC Films
DeLeon, R. L. ; Sun, L. ; Rexer, E. ; Charlebois, J. ; Garvey, J. F. ; Forsythe, E. W. ; Tompa, G. S.
Pub. info.: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.573-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 441