1.

Conference Proceedings
Conference Proceedings
1. Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy
Burton, J.C. ; Sun, L. ; Pophristic, M. ; Lukacs, S. ; Cohen, S. ; Long, F.H. ; Liang, S. ; Lu, Y. ; Feng, Z.C. ; Li, Y. ; Tran, C.
Pub. info.: Proceedings of the Second Symposium on III-V Nitride Materials and Processes.  pp.220-227,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-34
2.

Conference Proceedings
Conference Proceedings
2. Spatial Characterization of Doped SiC Wafers
Burton, J. C. ; Sun, L. ; Pophristic, M. ; Li, J. ; Long, F. H. ; Feng, Z. C. ; Ferguson, I.
Pub. info.: Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.297-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 512