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12 results

Conference Proceedings

1. Long Distance Point Defect Migration in Irradiated SiC Observed by Deep Level Transient Spectroscopy

Alfieri, G. ; Grossner, U. ; Monakhov, E.V. ; Svensson, B.G. ; Steeds, J.W. ; Sullivan, W.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.485-488, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

2. High Energy Local Vibrational Modes of Carbon Aggregates in SiC: Experimental and Theoretical Insight

Mattausch, A ; Bockstedte, M. ; Pankratov, O. ; Steeds, J.W. ; Furkert, S.A. ; Hayes, J.M. ; Sullivan, W. ; Wright, N.G.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.465-468, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

3. Investigation of the Displacement Threshold of Si in 4H SiC

Sullivan, W. ; Steeds, J.W.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.481-484, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

4. Origin of the Up-Conversion Process in 4H SiC

Steeds, J.W. ; Furkert, S.A. ; Sullivan, W. ; Wagner, G.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.473-476, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

5. Microstructural Characterization Of Sintered Ba(Mg_1/3Ta2/3)O3 Materials By Transmission Electron Microscopy And Convergent Beam Electron Diffraction

Steeds, J.W. ; Lin, I-N.

Pub. info.:	Perovskite materials : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.219-224, 2002. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	718

Conference Proceedings

6. Micro-Raman and Photoluminescence Study on n-type 6H-SiC

Feng, Z.C. ; Chua, S.J. ; Evans, A.G. ; Steeds, J.W. ; Williams, K.P.J. ; Pitt, G.D.

Pub. info.:	Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000. pp.345-348, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	353-356

Conference Proceedings

7. Differentiation between C and Si Related Damage Centres in 4H- and 6H-SiC by the Use of 90-300 kV Electron Irradiation Followed by Low Temperature Photoluminescence Microscopy

Steeds, J.W. ; Carosella, F. ; Evans, A.G. ; Ismail, M.M. ; Danks, L. R. ; Voegeli, W.

Pub. info.:	Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000. pp.381-384, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	353-356

Conference Proceedings

8. Low Temperature Annealing of Optical Centres in 4H SiC

Steeds, J.W. ; Furkert, S. ; Hayes, J.M. ; Sullivan, W.

Pub. info.:	Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003. pp.637-640, 2004. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	457-460

Conference Proceedings

9. Electron Irradiation of 4H SiC by TEM: An Optical Study

Sridhara, S.G. ; Persson, P.O.Å. ; Carlsson, F.H.C. ; Bergman, J.P. ; Janzen, E. ; Evans, G. ; Steeds, J.W.

Pub. info.:	Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	640

10.

Conference Proceedings

10. Further Investigation of Silicon Vacancy-Related Luminescence in 4H and 6H SiC

Steeds, J.W. ; Furkert, S. ; Hayes, J.M. ; Sullivan, W.

Pub. info.:	Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003. pp.561-564, 2004. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	457-460

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