1.

Conference Proceedings
Conference Proceedings
1. Structural and Optical Characterization of Polycrystalline Silicon Films Deposited by Single Wafer CVD
Sassela, A. ; Borghesi, A. ; Amore, G. ; Tallarida, G. ; Spiga, S. ; Cazzaniga, F. ; Ferroni, G. ; Queirolo, G.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.1282-1288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
2.

Conference Proceedings
Conference Proceedings
2. Evaluating the Denuded Zone Depth by Measurements of the Recombination Activity of Bulk Defects
Polignano, M. L. ; Brambilla, M. ; Cazzaniga, F. ; Pavia, G. ; Zanderigo, F. ; Spiga, S. ; Moro, L. ; Castaldini, A. ; Cavallini, A.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.569-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510