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Conference Proceedings

1. Role of acid charge in chemically amplified resists

Shi, X.

Pub. info.:	Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.342-347, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3678

Conference Proceedings

2. Experimental study of line-end shortening

Shi, X. ; Socha, R. J. ; Bendik, J. ; Dusa, M. V. ; Conley, W. ; Su, B.

Pub. info.:	Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.777-784, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3678

Conference Proceedings

3. New Approaches to Spin Valve Head Materials and Its Future Trends

Tong, H.C. ; Qian, C. ; Miloslavsky, L. ; Shi, X. ; Liu, F. ; Huai, Y. ; Lederman, M. ; Dey, S.

Pub. info.:	Proceedings of the Fifth International Sympposium on Magnetic Materials, Processes, and Devices : applications to storage and microelectromechanical systems (MEMS). pp.141-155, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-20

Conference Proceedings

4. An enhanced Voronoi diagram method for segmentation of partially overlapped thin objects

Wu, Q.M.J. ; Shi, X. ; Jerbi, A. ; Grover, C.P.

Pub. info.:	Applications of digital image processing XXI : 21-24 July 1998, San Diego, California. pp.145-153, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3460

Conference Proceedings

5. Optical Limiting Processes in Derivatized Fullerenes and Porphyrins/Phthalocyanines

Kohlman, R. ; Klimov, V. ; Shi, X. ; Grigorova, M. ; Mattes, B. R. ; McBranch, D. ; Wang, H. ; Wudl, F. ; Nogues, J-L. ; Moreshead, W.

Pub. info.:	Electrical, optical, and magnetic properties of organic solid-state materials IV : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.237-, 1998. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	488

Conference Proceedings

6. Electron Field Emission From Multilayered Tetrahedral Amorphous Carbon Films

Shi, X. ; Cheah, L. K. ; Silva, S. R. P. ; Tay, B. K. ; Yang, H. S. ; Sun, Z.

Pub. info.:	Covalently bonded disordered thin-film materials : symposium held December 2-4, 1997, Boston, Massachusetts, U.S.A.. pp.215-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	498

Conference Proceedings

7. Dislocation Substructure in NiAl Single Crystals Deformed at Ambient Temperature

Shi, X. ; Pollock, T. M. ; Mahajan, S. ; Arunachalam, V. S.

Pub. info.:	High-Temperature ordered intermetallic alloys VII : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.493-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	460

Technical Paper

8. SOLAR NEUTRINOS AND THE MSW EFECT FOR THREE-NEUTRINO MIXING

Shi, X. ; Schramm, David N.

Pub. info.:

NASA Technical Reports. (NASA-CR-188706), pp.1-31, 1991. National Aeronautics and Space Adminstration

Technical Paper

9. Determination of the workspace of a general 6 DOF paralle manipulator

Fenton, R.G. ; Shi, X.

Pub. info.:

SME technical paper series. pp.1P-, 1991. Society of Manufacturing Engineers

10.

Conference Proceedings

10. Resolution enhancement with high-transmission attenuating phase-shift masks

Socha, R. J. ; Conley, W. E. ; Shi, X. ; Dusa, M. V. ; Petersen, J. S. ; Chen, F. ; Wampler, K. E. ; Laidig, T. L. ; Caldwell, R. F.

Pub. info.:	Photomask and X-Ray Mask Technology VI. pp.290-314, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3748

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