1.

Conference Proceedings
Conference Proceedings
1. Rietveld refinement of the phase of NH4NO3 measured in-situ under different diffraction geometries
Herrmann,M. ; Engel,W. ; Schneider,J. ; Gobel,H.
Pub. info.: EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria.  Part2  pp.489-494,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 166-169
2.

Conference Proceedings
Conference Proceedings
2. Application of combined neutron and X-ray powder diffraction refinements to the structure of congruent lithium niobate
Zotov,N. ; Boysen,H. ; Schneider,J. ; Frey,F.
Pub. info.: EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria.  Part2  pp.631-636,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 166-169
3.

Conference Proceedings
Conference Proceedings
3. Studies of structural and luminescent properties of Gd3Ga5012:Cr and corresponding solid solutions
Ilmer,M. ; Schneider,J. ; Ostertag,M. ; Berthold,T. ; Bohaty,L. ; Grabmaier,B.C.
Pub. info.: EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria.  Part2  pp.801-806,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 166-169
4.

Conference Proceedings
Conference Proceedings
4. ODMR Studies of MOVPE-Grown GaN Epitaxial Layers
Kunzer,M. ; Kaufmann,U. ; Maier,K. ; Schneider,J. ; Herres,N. ; Akasaki,I. ; Amano,H.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.87-92,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings
Conference Proceedings
5. Iron Acceptors in Gallium Nitride(GaN)
Maier,K. ; Kunzer,M. ; Kaufmann,U. ; Schneider,J. ; Monemar,B. ; Akasaki,I. ; Amano,H.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.93-98,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147