Hartmann, J.M. ; Papon, A.M. ; Holliger, P. ; Rolland, G. ; Billon, T. ; Rouviere, M. ; Vivien, L. ; Laval, S.
Pub. info.:
High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.147-152, 2004. Warrendale, Pa.. Materials Research Society
Bogumilowicz, Y. ; Hartmann, J.M. ; Laugier, F. ; Rolland, G. ; Billon, T. ; Renard, V. ; Olshanetsky, E.B. ; Estibals, O. ; Kvon, Z.D. ; Portal, J.C.
Pub. info.:
High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.45-50, 2004. Warrendale, Pa.. Materials Research Society
Allegret, S. ; Rolland, G. ; Guidotti, E. ; Yamasaki, H. ; Holliger, P. ; Pierre, F. ; Martin, F.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.324-330, 2005. Pennington, NJ. Electrochemical Society
Peyrard, P.-F. ; Beutier, T. ; Serres, O. ; Chatry, C. ; Ecoffet, R. ; Rolland, G. ; Boscher, D. ; Bourdarie, S. ; Inguimbert, C. ; Calvel, P. ; Mangeret, R.
Pub. info.:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands. pp.639-642, 2004. Noordwijk, the Netherlands. ESA Publication Division
Blin, D. ; Rochat, N. ; Rolland, G. ; Holliger, P. ; Martin, F. ; Damlencourt, J.-F. ; Lardin, T. ; Besson, P. ; Haukka, S. ; Semeria, M.-N.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.233-242, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bogumilowicz, Y. ; Hartmann, J.M. ; Damlencourt, J.F. ; Vandelle, B. ; Abbadie, A. ; Papon, A.-M. ; Rolland, G. ; Holliger, P. ; Di Nardo, C. ; Besson, P. ; Ernst, T. ; Billon, T. (CEA-LETI)
Pub. info.:
SiGe: materials, processing, and devices : proceedings of the First international symposium. pp.665-680, 2004. Pennington, N.J.. Electrochemical Society
Cosnier, V. ; Dabertrand, K. ; Blonkowski, S. ; Lhostis, S. ; Zoll, S. ; Morand, Y. ; Descombes, S. ; Guillaumot, B. ; Hobbs, C. ; Rochat, N. ; Rolland, G. ; Renault, O. ; Garros, X. ; Casse, M. ; Mitard, J. ; Lehnen, P. ; Miedl, S. ; Lindner, J. ; Schumacher, M.
Pub. info.:
Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A.. pp.287-292, 2004. Warrendale, Pa.. Materials Research Society
Bun, D. ; Rochat, N. ; Rolland, G. ; Holliger, P. ; Martin, F. ; Damlencourt, J.-F. ; Lardin, T. ; Besson, P. ; Haukka, S. ; Semeria, M.-N.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.233-242, 2003. Pennington, NJ. Electrochemical Society
Germanicus, R. ; Dusseau, L. ; Fesquet, I. ; Gasiot, J. ; Barde, S. ; Rolland, G. ; Ecoffet, R. ; Mion, O. ; Barillot, C. ; Calvel, P.
Pub. info.:
Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. pp.261-264, 2002. Noordwijk, The Netherlands. ESA Publications Division
Bernardi, P. ; Lapeyrere, V. ; Buey, J.-T. ; Parisot, J. ; Schmidt, R. ; LeRuyet, B. ; Tiphene, D. ; Gilard, O. ; Rolland, G.
Pub. info.:
Second Eddington Workshop, Stellar Structure and Habitable Planet Finding, 9-11 April 2003, Palermo, Italy. pp.191-196, 2004. Noordwijk, The Netherlands. ESA Publications Division