1.

Conference Proceedings

Conference Proceedings
Resnick, P.J. ; Hankins, M.G.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS II.  pp.229-237,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4980
2.

Conference Proceedings

Conference Proceedings
Hankins, M.G. ; Resnick, P.J. ; Clews, P.J. ; Mayer, T.M. ; Wheeler, D.R. ; Tanner, D.M. ; Plass, R.A.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS II.  pp.238-247,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4980