1.

Conference Proceedings
Conference Proceedings
1. Interface Defects of Bonded Silicon Wafers
Reiche,M. ; Tong,Q.-Y. ; Gosele,U. ; Heydenreich,J.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1847-1852,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. On the Influence of Transition Metal Impurities on the Oxygen Precipitation in CZ-Grown Silicon
Reiche,M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1529-1534,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Contamination and Cleaning of GaAs-(lOO)Surfaces
Gutjahr,K. ; Reiche,M. ; Gbsele,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1967-1972,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201