International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine. pp.197-201, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Podor,B. ; Savel'ev,I. G. ; loffe A. F. ; Kovacs,Gy. ; Remenyi,G. ; Gombos,G. ; Kreshchuk,A.M. ; Novikov,S. V.
Pub. info.:
Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine. pp.46-50, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Podor,B. ; Vignaud,D. ; Tiginyanu,I. M. ; Csontos,L. ; Ursaki,V. V. ; Shontya,V. P.
Pub. info.:
Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine. pp.142-145, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering