Petroff, P.M. ; Qian, Xueyu ; Holtz, Per Olof ; Simes, R.J. ; English, J.H. ; Merz, J. ; Kubena, R.
Pub. info.:
Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.. pp.55-64, 1988. Pittsburgh, Pa.. Materials Research Society
Liu, T. Y. ; Petroff, P.M. ; Kroemer, H. ; Gossard, A. C.
Pub. info.:
III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A.. pp.393-398, 1989. Pittsburgh, Pa.. Materials Research Society
Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.19-26, 1985. Pittsburgh, Pa.. Materials Research Society
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.433-440, 1985. Pittsburgh, Pa.. Materials Research Society
Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.457-464, 1981. New York. North Holland