Yim, D. ; Yang, H. ; Park, C. ; Hong, J. ; Choi, J.
Pub. info.:
Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA. pp.107-118, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Banda, S. ; Ounaies, Z. ; St Clair, T. ; Rud, J. ; Burney, K. ; Bowlin, G. ; Park, C. ; Harrison, J.
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Smart structures and materials 2005 : Active materials : behavior and mechanics : 7-10 March 2005, San Diego, California, USA. pp.12-22, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chung, H. ; Park, C. ; Xie, Q. ; Chou, P. ; Shinozuka, M.
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Nondestructive detection and measurement for homeland security III : 7-9 March, 2005, San Diego, California, USA. pp.70-79, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering