1.

Conference Proceedings

Conference Proceedings
Hwang, J. ; Huang, M. ; Anderson, T. ; Park, C.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.85-91,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
2.

Conference Proceedings

Conference Proceedings
Park, C. ; Han, S. ; Dob, C. ; Yeo, S. ; Yoon, D. ; Hwang, S.-K. ; Lee, K.-H. ; Anderson, T.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.92-97,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
3.

Conference Proceedings

Conference Proceedings
Park, C. ; Ko, H. ; Kim, T.
Pub. info.: Third International conference on virtual reality and its application in industry : 9-12 April 2002, Hangzhou, China.  pp.178-184,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4756
4.

Conference Proceedings

Conference Proceedings
Park, C. ; Dutta, I. ; Peterson, K. A. ; Vella, J.
Pub. info.: Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A..  pp.385-390,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 766
5.

Conference Proceedings

Conference Proceedings
Park, C. ; Kim, I.-J. ; Ahn, S. C. ; Ko, H. ; Kwon, Y.-M. ; Kim, H.-G.
Pub. info.: Third International conference on virtual reality and its application in industry : 9-12 April 2002, Hangzhou, China.  pp.286-293,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4756
6.

Conference Proceedings

Conference Proceedings
Hong, J. ; Woo, C. ; Park, J. ; Cho, B. ; Choi, J.-S. ; Yang, H. ; Park, C. ; Shin, Y.-C. ; Kim, Y. ; Jeong, G. ; Kim, J. ; Kang, K. ; Kang, C. ; Yim, D. ; Song, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.406-414,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038