1.

Conference Proceedings
Conference Proceedings
1. Silsesquioxane-based 193 nm bilayer resists: characterization and lithographic evaluation
Bravo-Vasquez, J. P. ; Kwark, Y.-J. ; Ober, C. K. ; Cao, H. B. ; Deng, H.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.109-121,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
2.

Conference Proceedings
Conference Proceedings
2. New liquid crystal materials enabling revolutionary display devices
Kornfield, J. A. ; Clark, N. A. ; Dalton, L. ; Marder, S. R. ; Ober, C. K. ; Palffy-Muhoray, P. ; Perry, J. W. ; Thomas, N. ; Walba, D. M. ; Wu, S.-T.
Pub. info.: Cockpit displays IX : displays for defense applications : 2-5 April 2002, Orlando, [Florida].  pp.336-349,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4712
3.

Conference Proceedings
Conference Proceedings
3. 3D defect engineering in polymer opals [6182-59]
Lange, B. ; Zentel, R. ; Jhaveri, S. J. ; Ober, C. K.
Pub. info.: Photonic Crystal Materials and Devices III (i.e. V).  pp.61821W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6182
4.

Conference Proceedings
Conference Proceedings
4. Molecular glass resists for next-generation lithography [6153-50]
Bratton, D. ; Ayothi, R. ; Felix, N. ; Cao, H. ; Deng, H. ; Ober, C. K.
Pub. info.: Advances in Resist Technology and Processing XXIII.  pp.61531D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6153
5.

Conference Proceedings
Conference Proceedings
5. The convergence of top-down and bottom-up nanofabrication: formation of 3D structures (Invited Paper)
Yang, D. ; Dai, J. ; Li, M. ; Ober, C. K.
Pub. info.: Nanofabrication: Technologies, Devices, and Applications.  pp.12-26,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5592