Iwamoto, S. ; Yoshida, H. ; Kishino, S. ; Niu, H. ; Maisuda, T ; Koyama, H.
Pub. info.:
Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.404-410, 1997. Pennington, NJ. Electrochemical Society
Shimizu, M. ; Fujisawa, H. ; Hyodo, S. ; Nakashima, S. ; Niu, H. ; Okino, H. ; Shiosaki, T.
Pub. info.:
Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.. pp.159-, 1998. Pittsburgh, Pa.. MRS - Materials Research Society
Fujisawa, H. ; Nakashima, S. ; Shimizu, M. ; Niu, H.
Pub. info.:
Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.327-, 1999. Warrendale, PA. MRS - Materials Research Society
Shimizu, M. ; Yoshida, M. ; Fujisawa, H. ; Niu, H.
Pub. info.:
Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.411-, 1999. Warrendale, PA. MRS - Materials Research Society
Shimizu, M. ; Hyodo, S. ; Fujisawa, H. ; Niu, H. ; Shiosaki, T.
Pub. info.:
Ferroelectric thin films V : symposium held April 7-12, 1996, San Francisco, California, U.S.A.. pp.201-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society