1.

Conference Proceedings
Conference Proceedings
1. STRAIN IN GRADED THICKNESS GaAs/Si HETEROEPITAXIAL STRUCTURES GROWN WITH A BUFFER LAYER
Nemanich, R.J. ; Biegelsen, D.K. ; Street, R.A. ; Downs, B. ; Krusor, B.S. ; Yingling, R.D.
Pub. info.: Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.245-250,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 116
2.

Conference Proceedings
Conference Proceedings
2. *RAMAN SPECTROCOPY FOR SEMICONDUCTOR THIN FILM ANALYSIS
Nemanich, R.J.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.23-38,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
3.

Conference Proceedings
Conference Proceedings
3. Raman spectroscopic evaluation of silicides formed with a scanned electron beam
Nemanich, R.J. ; Sigmon, T.W. ; Johnson, N.M. ; Moyer, M.D. ; Lau, S.S.
Pub. info.: Laser and electron-beam solid interactions and materials processing : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.541-546,  1981.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 1
4.

Conference Proceedings
Conference Proceedings
4. Correlated electrical and microstructural studies of recrystallized silicon thin films on bulk glass substrates
Biegelsen, D.K. ; Johnson, N.M. ; Nemanich, R.J. ; Moyer, M.D. ; Fennell, L.E.
Pub. info.: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.331-336,  1982.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 4
5.

Conference Proceedings
Conference Proceedings
5. INITIAL NUCLEATION AND THE EFFECTS ON EPITAXIAL SILICIDE FORMATION
Nemanich, R.J. ; Doland, C.M. ; Fulks, R.T. ; Ponce, F.A.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.255-260,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
6.

Conference Proceedings
Conference Proceedings
6. IN SITU ELLIPSOMETRIC STUDIES OF PALLADIUM SILICIDE FORMATION
Kelso, S.M. ; Nemanich, R.J. ; Doland, C.M.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.23-28,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54