1.

Conference Proceedings
Conference Proceedings
1. Critical and Sub-Critical Debonding in Nano-Clustering Porous Low-k Films
Smith, R.S. ; Uchibori, C.J. ; Ho, P.S. ; Nakamura, T.
Pub. info.: Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A..  pp.83-88,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 914
2.

Conference Proceedings
Conference Proceedings
2. Dynamic Characteristics of 4H-SiC pin Dlode on (000-1)C-Face with Small Forward Degradation
Nakayama, K. ; Sugawara, Y. ; Ishii, R. ; Tsuchida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1359-1362,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Comparison of Propagation and Nucleation of Basal Plane Dislocations in 4H-SiC(000-1) and (0001) Epitaxy
Tsuchida, H. ; Kamata, I. ; Miyanagi, T. ; Nakamura, T. ; Nakayama, K. ; Ishii, R. ; Sugawara, Y.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.231-234,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
4.

Conference Proceedings
Conference Proceedings
4. Deep Level Defects Related to Carbon Displacements in n- and p-Type 4H-SiC
Storasta, L. ; Kamata, I. ; Nakamura, T. ; Tsuchida, H.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.489-492,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
5.

Conference Proceedings
Conference Proceedings
5. Development of Non-Destructive In-House Observation Techniques for Dislocations and Stacking Faults in SiC Epilayers
Kamata, I. ; Tsuchida, H. ; Miyanagi, T. ; Nakamura, T.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.415-418,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
6.

Conference Proceedings
Conference Proceedings
6. Solid polymer electrolyte membrane flow sensor for tracheal tube [6167-28]
Ihara, T. ; Ikada, Y. ; Nakamura, T. ; Mukai, T. ; Asaka, K.
Pub. info.: Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA.  pp.61670U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6167
7.

Conference Proceedings
Conference Proceedings
7. Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping
Miyanagi, T. ; Tsuchida, H. ; Kamata, I. ; Nakamura, T. ; Ishii, R. ; Nakayama, K. ; Sugawara, Y.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.375-378,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
8.

Conference Proceedings
Conference Proceedings
8. High Rate Deposition (>60 nm/mm) of Highly Permeable Ni-Zn Ferrite Films from Aqueous Solutions
Matsushita, N. ; Nakamura, T. ; Abe, M.
Pub. info.: Magnetic materials, processes, and devices VII and electrodeposition of alloys : proceedings of the International Symposium.  pp.554-560,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-27
9.

Conference Proceedings
Conference Proceedings
9. Fracture Behavior of Brittle Coating Layer on Metal Substrate
Ochiai, S. ; Tomida, T. ; Nakamura, T. ; Iwamoto, S. ; Okuda, H. ; Tanaka, M. ; Hojo, M.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.929-932,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(2)
10.

Conference Proceedings
Conference Proceedings
10. Investigation of Basal Plane Dislocations in the 4H-SiC Epilayers Grown on {0001} Substrates
Tsuehida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T. ; Izumi, K. ; Nakayama, K. ; Ishii, R. ; Asano, K. ; Sugawara, Y.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.97-100,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485