1.

Conference Proceedings
Conference Proceedings
1. Emission and capture kinetics for a hydrogen-related negative-U center in silicon:evidence for metastable neutral charge state
Markevich,V.P. ; Murin,L.I. ; Sekiguchi,T. ; Suezawa,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.217-222,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Tbe oxygen dimer in silicon:some experimental observatiol's
Hallberg,T. ; Lindstrom,J.L. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.361-366,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Formation of Oxygen Dimers in Silicon during Electron-Irradiation Above 250 °C
Lindstrom,J.L. ; Hallberg,T. ; Aberg,D. ; Svensson,B.G. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.367-372,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. Effect of Carbon on Thermal Double Donor Formation in Silicon
Murin,L.I. ; Markevich,V.P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1315-1320,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Me0tastability and Negative-U Properties for Hydrogen-Related Radiation-Induced Defect in Silicon
Markevich,V.P. ; Medvedeva,I.F. ; Murin,L.I. ; Sekiguchi,T. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.945-950,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201