1.

Conference Proceedings
Conference Proceedings
1. Enhanced amorphous silicon technology for 320×240 microbolometer arrays with a pitch of 35μm
Mottin,E. ; Martin,J.-L. ; Ouvrier-Buffet,J.-L. ; Vilain,M. ; Bain,A. ; Yon,J.-J. ; Tissot,J.L. ; Chatard,J.P.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.250-256,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings
Conference Proceedings
2. 320｡ﾟ240 microbolometer uncooled IRFPA
Mottin,E. ; Martin,J.-L. ; Ouvrier-Buffet,J.-L. ; Vilain,M. ; Yon,J.-J. ; Chatard,J.P.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.40-46,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
3.

Conference Proceedings
Conference Proceedings
3. Long linear MWIR and LWIR HgCdTe arrays for high-resolution imaging
Chamonal,J.P. ; Mottin,E. ; Audebert,P. ; Ravetto,M. ; Caes,M. ; Chatard,J.-P.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.452-462,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
4.

Conference Proceedings
Conference Proceedings
4. 320×240 microbolometer uncooled IRFPA development
Tissot,J.-L. ; Martin,J.-L. ; Mottin,E. ; Vilain,M. ; Yon,J.-J. ; Chatard,J.-P.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.473-479,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130