1.

Conference Proceedings
Conference Proceedings
1. Infrared image target detection process using continuous features
Kikuchi,M. ; Tamura,H. ; Ono,M. ; Miyauchi,H. ; Kobayashi,S.
Pub. info.: Automatic target recognition X : 26-28 April 2000, Orlando, USA.  pp.465-475,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4050
2.

Conference Proceedings
Conference Proceedings
2. Diagnosing abnormal operating conditions of rotational machineries and machine tools with physical wavelets
Takeda,F. ; Okada,S. ; Imade,M. ; Miyauchi,H.
Pub. info.: Process Control and Inspection for Industry.  pp.417-426,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222