1.

Conference Proceedings
Conference Proceedings
1. Development of a figure correction method having spatial resolution close to 0.1 mm
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.105-111,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
2.

Conference Proceedings
Conference Proceedings
2. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.11-17,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
3.

Conference Proceedings
Conference Proceedings
3. Hard x-ray nano-focusing of 40nm level using K-B mirror optics for nanoscopy/spectroscopy [5918-05]
Matsuyama, S. ; Mimura, H. ; Yumoto, H. ; Hara, H. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Tshikawa, T. ; Yamauchi, K.
Pub. info.: Laser-generated, synchrotron, and other laboratory X-ray and EUV sources, optics, and applications II : 2-4 August 2005, San Diego, California, USA.  pp.591804-591804,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5918
4.

Conference Proceedings
Conference Proceedings
4. Fabrication of Si field emitters with a focus electrode [6030-01]
Mimura, H. ; Neo, Y. ; Shimawaki, H.
Pub. info.: ICO20 : display devices and systems : 21-26 August, 2005, Changchun, China.  pp.603001-603001,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6030
5.

Conference Proceedings
Conference Proceedings
5. High-spatial-resolution scanning x-ray fluorescence microscope with Kirkpatrick-Baez mirrors [6317-48]
Matsuyama, S. ; Mimura, H. ; Shimura, M. ; Yumoto, H. ; Katagishi, K. ; Handa, S. ; Shibatani, A. ; Sano, Y. ; Yamamura, K. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631719-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
6.

Conference Proceedings
Conference Proceedings
6. Wave-optical simulations for designing and evaluating hard x-ray reflective optics [6317-47]
Mimura, H. ; Matsuyama, S. ; Yumoto, H. ; Handa, S. ; Shibatani, A. ; Katagishi, K. ; Sano, Y. ; Nishino, Y. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631718-631718,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
7.

Conference Proceedings
Conference Proceedings
7. Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories [5921-21]
Assoujfid, L. ; Rommeveaux, A. ; Ohashi, H. ; Yamauchi, K. ; Mimura, H. ; Qian, J. ; Hignette, O. ; Ishikawa, T. ; Morawe, C. ; Macrander, A. ; Khounsary, A. ; Goto, S.
Pub. info.: Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA.  pp.59210J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5921
8.

Conference Proceedings
Conference Proceedings
8. Surface figuring and measurement methods with spatial resolution close to 0.1 mm for x-ray mirror frabrication [5921-24]
Mimura, H. ; Yumoto, H. ; Matsuyama, S. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, Y.
Pub. info.: Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA.  pp.59210M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5921
9.

Conference Proceedings
Conference Proceedings
9. Field emitter type CdTe radiation detector for x-ray imager [6319A-53]
Sakata, T. ; Ikeda, Y. ; Shiozawa, K. ; Neo, Y. ; Morii, H. ; Aoki, T. ; Mimura, H.
Pub. info.: Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA.  pp.63190O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6319
10.

Conference Proceedings
Conference Proceedings
10. At-wavelength figure metrology of total reflection mirrors in hard x-ray region (Invited Paper) [6317-09]
Yumoto, H. ; Mimura, H. ; Matsuyama, S. ; Handa, S. ; Shibatani, A. ; Katagishi, K. ; Sano, Y. ; Yabashi, M. ; Nishino, Y. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631709-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317