1.

Conference Proceedings
Conference Proceedings
1. Scanning Probe Microscopy (SPM) for the Investigation of Local Electrical Properties of High-K Dielectric/Ferroelectric Films
Landau, S. A. ; Weiss, P-A. ; Junghans, N. ; Kolbesen, B. O. ; Adderton, D. ; Schindler, G. ; Hartner, W. ; Hintermaier, F. ; Dehm, C. ; Mazure, C.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.567-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
2.

Conference Proceedings
Conference Proceedings
2. Correlations Between Composition, Texture, and Polarization in SrxBiyTa2O5+x+3y/2 Thin Films Deposited by MOCVD
Hendrix, B. C. ; Hintermaier, F. ; Desrochers, D. A. ; Roeder, J. F. ; Baum, T. H. ; Dehm, C. ; Nagel, N. ; Honlein, W. ; Mazure, C.
Pub. info.: Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.275-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 541