1.

Conference Proceedings
Conference Proceedings
1. Gas and heat treatment effects on the defect structure of a-SiC:H films
Friessnegg,T. ; Boudreau,M. ; Mascher,P. ; Simpson,P.J. ; Puff,W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.709-714,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Vacancy-type defects in proton-irradiated SiC
Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumam,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.733-738,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Vacancy-type defects in eloctron and proten irradiated II-VI compounds
Brunner,S. ; Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumann,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1419-1424,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. Vacancy Type Defects in Proton Irradiated SiC
Puff,W. ; Balogh,A.G. ; Mascher,P. ; Baumann,H.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.285-288,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
5.

Conference Proceedings
Conference Proceedings
5. Hydrogen and Nitrogen Loss during ERD Analysis of Silicon(Oxy)nitrides
Wallace,S.G. ; Kockelkoren,A.C. ; Boudreau,M.G. ; Mascher,P. ; Forster,J.S. ; Davies,J.A.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.381-384,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
6.

Conference Proceedings
Conference Proceedings
6. Defect characterization of II-VI compownd semiconductors using positron lifetime spectroscopy
Tessaro,G. ; Mascher,P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1335-1340,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings
Conference Proceedings
7. Vacaucy-Type Defects in Electron and Proton Irradiated ZnS and ZnTe
Brunner,S. ; Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumann,H.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.503-505,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257