1.

Conference Proceedings
Conference Proceedings
1. Defect Distribution Across 6-Inch CZ-Silicon Wafers
Puff,W. ; Mascher,P. ; Hahn,S. ; Cho,K.H. ; Lee,B.Y.
Pub. info.: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.1185-1188,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 105-110
2.

Conference Proceedings
Conference Proceedings
2. Defect distribution in large CZ-silicon wafers investigated by positron annihilation spectroscopy
Mascher,P. ; Puff,W. ; Hahn,S. ; Cho,K.H. ; Lee,B.Y.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.413-418,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87