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16 results

Conference Proceedings

1. Comprehensive Optical and Compositional Characterization of Silicon-based Thin Films for Photonics

Wojcik, J. ; Irving, E.A. ; Davies, J.A. ; Lennard, W.N. ; Mascher, P.

Pub. info.:	Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.381-395, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-2

Conference Proceedings

2. Characterization of Silicon Oxynitride Thin Films Deposited By ECR-PECVD

Simionescu, C. ; Wojcik, J. ; Haugen, H.K. ; Davies, J.A. ; Mascher, P.

Pub. info.:	Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium. pp.206-213, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-7

Conference Proceedings

3. Bulk Studies of Defects in Semiconductors

Mascher, P.

Pub. info.:	Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany. pp.30-34, 2001. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	363-365

Conference Proceedings

4. Influence of the Microwave Power in an ECR-PECVD Reactor on Dielectric-Cap Induced Blue Shifi in 1.55 μm Laser Structures

Wojcik, J. ; Robinson, B. ; Thompson, D.A. ; Mascher, P.

Pub. info.:	Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium. pp.624-629, 2003. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-8

Conference Proceedings

5. Evaluation of Precursors for the Chemical Vapour Deposition of Tin Oxide

Siminsescu, C. ; Bounasri, F. ; Wallace, S.G. ; Haugen, H.K. ; Davies, J.A. ; Mascher, P.

Pub. info.:	CVD XV, proceedings of the fifteenth International Symposium on Chemical Vapor Deposition. pp.765-772, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-13

Conference Proceedings

6. Silicon nanocrystal formation in silicon-rich silicon oxide thin films

Roschuk, T. R. ; Wojcik, J. ; Irving, E. A. ; Flynn, M. ; Mascher, P.

Pub. info.:	Applications of photonic technology [7A] : closing the gap between theory, development, and application : 7A--Photonics North 2004: Optical components and devices. pp.450-458, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5577

Conference Proceedings

7. Characterization of Radiation- Induced Defects in ZnO Probed by Positron Annihilation Spectroscopy

Brunner, S. ; Puff, W. ; Balogh, Adam G. ; Mascher, P.

Pub. info.:	Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany. pp.141-143, 2001. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	363-365

Conference Proceedings

8. Optical Properties of Nanostructures Based on Silicon Rich Silicon Oxide (SRSO) Thin Films

Roschuk, T. ; Wojcik, J. ; Comedi, D. ; Flynn, M.J. ; Irving, E.A. ; Zalloum, O.H.Y. ; Mascher, P.

Pub. info.:	Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium. pp.136-147, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2005-01

Conference Proceedings

9. Electron Cyclotron Resonance Plasma Enhanced Chemical Vapour Depo- sition (ECR-PECVD): A Versatile Tool in the Fabrication of Optoelectronic Devices

Wojcik, J. ; Mascher, P.

Pub. info.:	Integrated optoelectronics : proceedings of the first international symposium. pp.3-22, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-4

10.

Conference Proceedings

10. Microstructural Evolution of Radiation-Induced Defects in Semi-Insulating SiC During Isochronal Annealing

Puff, W. ; Balogh, A. G. ; Mascher, P.

Pub. info.:	Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.965-968, 2000. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	338-342(2)

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