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Conference Proceedings

1. The Influence of the Interface Trap Densities on the Extraction of the Silicon Film and Front Oxide Thickness of SOI NMOS Devices at Low Temperatures

Nicolett, A.S. ; Martino, J.A. ; Simoen, F. ; Claeys, C.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.28-34, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

2. A Simple Analytical Model of Graded-Channel SOI nMOSFET Transconductance

Gimenez, S.P. ; Pavanello, M.A. ; Martino, J.A.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.45-54, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

3. A Physically-Based Continuous Model for Graded-Channel SOI MOSFET

Pavanello, M.A. ; Ifiiguez, B. ; Martino, J.A. ; Flandre, D.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.35-44, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

4. Comparison Between 0.13 μm Partially-Depleted Silicon-On-Insulator Technology with Floating Body Operation at 300 K and 90 K

Pavanello, M.A. ; Martino, J.A. ; Mercha, A. ; Rafi, J.M. ; Simoen, E. ; Claeys, C. ; van Meer, H. ; De Meyer, K.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.205-212, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

5. Behavior of Graded-Channel Fully Depleted SOI NMOSFET at High Temperatures

Galeti, M. ; Pavanello, M.A. ; Martino, J.A.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.342-350, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

6. Analog Performance of Graded-Channel SOI NMOSFETS at Low Temperatures

Pavanello, M.A. ; Martino, J.A. ; Flandre, D.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.20-27, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

7. Determination of the Silicon Film Doping Concentration and the Back Interface Oxide Charge Density using SOI-NMOS Gate Capacitor

Sonnenberg, V. ; Martino, J.A.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.2-11, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

8. The Leakage Current Composition in Thin Film SOI NMOSFETS at High Temperatures

Bellodi, M. ; Martino, J.A.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.12-19, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

Conference Proceedings

9. Influence of the Back Gate Voltage on the Total Series Resistance of Fully Depleted SOI MOSFETS at 300 K and 77 K

Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.430-436, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

10.

Conference Proceedings

10. Difference Between Kink and Bipolar Parasitic Effects in Thin Film SOI MOSFET

Hoashi, P.T. ; Martino, J.A.

Pub. info.:	Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.420-429, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-8

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