1.

Conference Proceedings
Conference Proceedings
1. High-temperature single-hole silicon transistors
Bagraev,N.T. ; Gehlhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A. ; Romanov,V.V.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.166-174,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
2.

Conference Proceedings
Conference Proceedings
2. Quantum interference and conductance in silicon quantum wires
Bagraev,N.T. ; Gehlhoff,W. ; lvanov,V.K. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naeser,A. ; Rykov,S.A. ; Shelykh,I.A.
Pub. info.: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.112-121,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3687
3.

Conference Proceedings
Conference Proceedings
3. Pair charge correlations in silicon nanostructures
Bagraev,N.T. ; Bouravleuv,A.D. ; Gasumyants,V.E. ; Gehihoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naeser,A.F.A. ; Romanov,V.V. ; Rykov,S.A. ; Vladimirskaya,E.V.
Pub. info.: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.105-111,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3687
4.

Conference Proceedings
Conference Proceedings
4. Low temperature impurity diffusion into large-band-gap semiconductors
Bagraev,N.T. ; Gippius,A.A. ; Klyachkin,L.E. ; Malyarenko,A.M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1833-1838,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Spin-dependent processes in self-assembly impurity quantum wires
Bagraev,N.T. ; Gelhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1683-1688,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings
Conference Proceedings
6. Infrared induced emission from silicon quantum wires
Bagraev,N.T. ; Chaikina,E.I. ; Gelhoff,W. ; Klyachkin,L.E. ; Markov,I.I. ; Malyarenko,A.M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1607-1612,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263