1.

Conference Proceedings
Conference Proceedings
1. Reduction in Elastic Response of Large Floating Structures Using Active Tendon Control
T. Hamamoto ; M. Inoue ; Y. Tanaka
Pub. info.: Ocean space utilization : presented at the 18th International Conference on Offshore Mechanics and Arctic Engineering, July 11-16, 1999, St. John's, Newfoundland, Canada.  6  pp.17-24,  1999.  New York.  American Society of Mechanical Engineers
Title of ser.: ASME Symposia Volumes
Ser. no.: OMAE 18(6)
2.

Conference Proceedings
Conference Proceedings
2. Influence of Medium Dose Ion Implantation on The Reliability of Thin Gate Oxides
K. Hagiwara ; K. Yoneda ; Y. Todokoro ; M. Inoue
Pub. info.: Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, amd Thin Insulator Materials.  pp.410-422,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-25
3.

Conference Proceedings
Conference Proceedings
3. The Reliability Evaluation of Thin Silicon Dioxide Using the Stepped Current TYDDB Technique
K. Yoneda ; K. Okuma ; K. Hagiwara ; Y. Todokoro ; M. Inoue
Pub. info.: Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, amd Thin Insulator Materials.  pp.390-399,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-25
4.

Conference Proceedings
Conference Proceedings
4. Development of High Power Excimer Laser Under AMMTRA Project
K. Haruta ; Y. Sato ; M. Inoue ; S. Fujikawa ; J. Saitoh
Pub. info.: ICALEO '93 : laser materials processing : proceedings : 24-28 October 1993, Orlando, Florida.  pp.270-277,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2306
5.

Conference Proceedings
Conference Proceedings
5. Replicating characteristics by SR lithography
H. Sumitani ; K. Itoga ; M. Inoue ; H. Watanabe ; N. Yamamoto
Pub. info.: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V : 20-21 February 1995, Santa Clara, California.  pp.94-103,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2437