1.

Conference Proceedings

Conference Proceedings
Ye,K. ; An,C. ; Hong,M. ; Lu,Y.
Pub. info.: Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA.  pp.174-182,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4557
2.

Conference Proceedings

Conference Proceedings
Lu,Y. ; Deng,T.
Pub. info.: Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China.  pp.369-374,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4548
3.

Conference Proceedings

Conference Proceedings
Xu,B. ; Chong,T.C. ; Liu,M.Y. ; Yuan,G. ; Lu,Y.
Pub. info.: Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China.  pp.233-236,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4085
4.

Conference Proceedings

Conference Proceedings
Liu,K. ; Ming,H. ; Lu,Y. ; Bai,M. ; Xie,J.
Pub. info.: Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China.  pp.220-223,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4085
5.

Conference Proceedings

Conference Proceedings
Fu,L. ; Shi,H. ; Ni,S. ; Lu,Y. ; Zhang,L. ; Xin,J.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.15-18,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
6.

Conference Proceedings

Conference Proceedings
DuanMu,Q. ; Tian,J. ; Li,Y. ; Jiang,D. ; Lu,Y. ; Fu,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.327-329,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
7.

Conference Proceedings

Conference Proceedings
Zhao,D. ; Chan,Y.K. ; Lu,Y.
Pub. info.: Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA.  pp.153-162,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4115
8.

Conference Proceedings

Conference Proceedings
Edwards Ⅲ,R.B. ; Lu,Y. ; Cole,B.J. ; Markel,M.D.
Pub. info.: Thermal treatment of tissue : energy delivery and assessment : 21-22 January 2001, San Jose, USA.  pp.139-150,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4247
9.

Conference Proceedings

Conference Proceedings
McCarthy,A. ; Tooley,F.A.P. ; Laprise,E. ; Plant,D.V. ; Kirk,A.G. ; Oren,M. ; Lu,Y.
Pub. info.: Optics in computing 2000 : 18-23 June 2000, Quebec city, Canada.  pp.272-277,  2000.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4089
10.

Conference Proceedings

Conference Proceedings
Gross,R. ; Klein,J. ; Wiedenhorst,B. ; Hofener,C. ; Schoop,U. ; Philipp,J.B. ; Schonecke,M. ; Herbstritt,F. ; Alff,L. ; Lu,Y. ; Marx,A. ; Schymon,S. ; Thienhaus,S. ; Mader,W.
Pub. info.: Superconducting and related oxides, physics and nanoengineering IV : 24-28 April 2000, Orlando, USA.  pp.278-294,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4058