1.

Conference Proceedings
Conference Proceedings
1. Expanding horizons of mesoporous materials to non-siliceous systems
Schuth, F. ; Czuryskiewicz, T. ; Kleitz, F. ; Linden, M. ; Lu, A. ; Rosenholm, J. ; Schmidt, W. ; Taguchi, A.
Pub. info.: Nanotechnology in mesostructured materials : proceedings of the 3rd International Mesostructured Materials Symposium, Jeju, Korea, July 8-11, 2002.  pp.399-406,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 146
2.

Conference Proceedings
Conference Proceedings
2. Application of simulation-based defect printability analysis at mask qualification control
Lu, J. ; Lu, A. ; Pang, L. ; Lee, D. ; Chen, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.33-40,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
3.

Conference Proceedings
Conference Proceedings
3. Monitoring the ecology and environment using remote sensing in the Jinta area/middle reaches of Heihe River Basin
Lu, A. ; Wang, L. ; Chen, X.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.621-628,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890
4.

Conference Proceedings
Conference Proceedings
4. Enhanced dispositioning of reticle defects for advanced masks using virtual stepper with automated defect severity scoring
Pang, L. ; Lu, A. ; Chen, J. ; Guo, E. ; Cai, L. ; Chen, J.-H.
Pub. info.: 23rd Annual BACUS Symposium on Photomask Technology.  pp.461-473,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5256
5.

Conference Proceedings
Conference Proceedings
5. Feedback model evaluation of high-mix product manufacturing [6152-163]
King, D. ; Cheng, M. ; Lu, A. ; Mao, Z. ; Liang, C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.615242-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152