1.

Conference Proceedings
Conference Proceedings
1. Ferroelectric PZT thin films on Si and SBN substrates
Neurgaonkar,R.R. ; Nelson,J.G. ; Lin,J. ; Cheng,J.
Pub. info.: Miniaturized systems with micro-optics and micromechanics II : 10-12 February 1997, San Jose, California.  pp.350-358,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3008
2.

Conference Proceedings
Conference Proceedings
2. Powder flow and catchment during coaxial laser cladding
Lin,J. ; Steen,W.M.
Pub. info.: Lasers in material processing : 16-20 June, 1997, Munich, FRG.  pp.517-528,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3097
3.

Conference Proceedings
Conference Proceedings
3. Two-photon absorption measured in the presence of strong one-photon saturation in cumulene-containing polymer
Meyer,R.K. ; Shkunov,M.N. ; Benner,R.E. ; Gellermann,W. ; Vardeny,Z.V. ; Lin,J. ; Barton,T.J.
Pub. info.: Optical probes of conjugated polymers : 28-30 July 1997, San Diego, California.  pp.483-494,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3145
4.

Conference Proceedings
Conference Proceedings
4. Low-debris laser plasma source
Chen,B. ; Lin,J. ; Zhang,X. ; Gao,J.
Pub. info.: Applications of X rays generated from lasers and other bright sources : 31 July-1 August 1997, San Diego, California.  pp.302-305,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3157
5.

Conference Proceedings
Conference Proceedings
5. Unique case study of low-yield analysis of 1 .5-ｦﾌm BiCMOS technology
Teoh,C.S. ; Lin,J.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.10-18,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3216