Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA. pp.282-287, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Bersuker, U. ; Zeitzoff, P. ; Brown, G. ; Kim, Y. ; Hoe, A. ; Lin, C. ; Young, C. ; Lysoght, P. ; Gardner, M. ; Murto, R. W ; Huff, H. R.
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Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium. pp.417-422, 2003. Pennington, NJ. Electrochemical Society
Advanced photonic sensors and applications II : 27-30 November 2001, Singapore. pp.16-21, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Puget, P. ; Stadler, E. ; Doyon, R. ; Gigan, P. ; Thibault, S. ; Luppino, G. ; Barrick, G. ; Benedict, T. ; Forveille, T. ; Rambold, W. ; Thomas, J. ; Vermeulen, T. ; Ward, J. ; Beuzit, J.-L. ; Feautrier, P. ; Magnard, Y. ; Mella, G. ; Prefs, O. ; Vallee, P. ; Wang, S. ; Lin, C. ; Hall, D. N. ; Hodapp, K. W.
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Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.970-977, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA. pp.107-114, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lin, C. ; Chen, C. ; Schneider, G.J. ; Lu, Z. ; Prather, D.W.
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Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA. pp.116-120, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering