1.

Conference Proceedings
Conference Proceedings
1. Cooperative spontaneous emission of excitons in the semiconductor microcavity
Liu,S. ; Lim,S. ; Wang,Q.
Pub. info.: Vertical-cavity surface-emitting lasers IV : 26-28 January 2000, San Jose, California.  pp.136-141,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3946
2.

Conference Proceedings
Conference Proceedings
2. Active pixel sensors fabricated in a standard 0.18-μm CMOS technology
Tian,H. ; Liu,X. ; Lim,S. ; Kleinfelder,S. ; Gamal,A.El
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  pp.441-449,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4306
3.

Conference Proceedings
Conference Proceedings
3. Integration of image capture and processing: beyond single-chip digital camera
Lim,S. ; Gamal,A.El
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  pp.219-226,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4306
4.

Technical Paper
Technical Paper
4. New Quaternion Feedback Control for Efficient Large Angle Maneuvers
Lim,S.
Pub. info.: A collection of technical papers : AIAA Guidance, Navigation and Control Conference, Montreal, Canada 6-9 August 2001.  Pt. 2  pp.958-966,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 2001
5.

Conference Proceedings
Conference Proceedings
5. Optical proximity correction of critical layers in DRAM process of 0.12-μm minimum feature size
Oh,Y.-H. ; Lee,J.-C. ; Park,K.-C. ; Go,C.S. ; Lim,S.
Pub. info.: Optical Microlithography XIV.  4346  pp.1567-1574,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346