1.

Conference Proceedings

Conference Proceedings
Kadirkamanathan,V. ; Li,P. ; Kirubarajan,T.
Pub. info.: Component and systems diagnostics, prognosis, and health management : 16-17 April 2001, Orlando, USA.  pp.263-274,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4389
2.

Conference Proceedings

Conference Proceedings
Zhao,Y. ; Li,P. ; Pu,Z.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.456-461,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
3.

Conference Proceedings

Conference Proceedings
Li,P. ; Corner,B.D. ; Paquette,S.
Pub. info.: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.172-177,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3958
4.

Conference Proceedings

Conference Proceedings
Li,P. ; Tang,W.
Pub. info.: Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas.  Part2  pp.1858-1861,  2000.  Bethel, CT.  Society for Experimental Mechanics
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4062
5.

Conference Proceedings

Conference Proceedings
Xiong,B. ; Wang,Z. ; Lu,X. ; Zhong,L. ; Zhang,Y. ; She,C. ; Xu,Z. ; Yang,R. ; Zhao,J. ; Li,P. ; Hua,P.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.326-330,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
6.

Conference Proceedings

Conference Proceedings
Li,P. ; Mu,X.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.251-253,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
7.

Conference Proceedings

Conference Proceedings
Zhao,Y. ; Li,P. ; Pu,Z. ; Sun,Z.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.205-209,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
8.

Conference Proceedings

Conference Proceedings
Zeng,Q. ; Hu,X. ; Zhang,Y. ; Li,P. ; Zeng,Q. ; Zeng,Y.
Pub. info.: International Conference on Sensors and Control Techniques (ICSC 2000).  pp.355-358,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4077
9.

Conference Proceedings

Conference Proceedings
Sun,Z. ; Li,P. ; Qiang,X. ; Zhao,Y.
Pub. info.: Process Control and Inspection for Industry.  pp.198-201,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222
10.

Conference Proceedings

Conference Proceedings
Li,P. ; Corner,B.D. ; Paquette,S.
Pub. info.: Three-Dimensional Image Capture and Applications IV.  pp.180-186,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4298