1.

Conference Proceedings
Conference Proceedings
1. Charge collection in multielectrode CdZnTe detectors
Prettyman,T.H. ; Smith,M.K. ; Luke,P.N. ; Amman,M.S. ; Lee,J.S.
Pub. info.: Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado.  pp.27-36,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3768
2.

Conference Proceedings
Conference Proceedings
2. Theory of quantized systems: formal basis for DEVS/HLA distributed simulation environment
Zeigler,B.P. ; Lee,J.S.
Pub. info.: Enabling technology for simulation science II : 14-16 April, 1998, Orlando, Florida.  pp.49-58,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3369
3.

Conference Proceedings
Conference Proceedings
3. Electron transport uniformity characterization of CdZnTe using alpha particles
Amman,M.S. ; Lee,J.S. ; Luke,P.N.
Pub. info.: Hard X-ray and gamma-ray detector physics and applications : 22-23 July 1998, San Diego, California.  pp.179-190,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3446
4.

Conference Proceedings
Conference Proceedings
4. Microstructural Investigation of Grain Boundary Diffusion and Recrystallization in W-Cu Composites
Lee,J.S. ; Kim,T.H. ; Lee,K.H.
Pub. info.: Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992.  pp.399-402,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 126-128
5.

Conference Proceedings
Conference Proceedings
5. Microdefects in Nitrogen Doped FZ Silicon Revealed by Li+ Drifting
Knowlton,W.B. ; Walton,J.T. ; Lee,J.S. ; Wong,Y.K. ; Haller,E.E. ; Ammon,W.v. ; Zulehner,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1761-1766,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings
Conference Proceedings
6. Model-based hierarchical motion compensation technique
Lee,J.S. ; Lee,S.U.
Pub. info.: Digital compression technologies and systems for video communications : 7-9 October 1996, Berlin, FRG.  pp.286-296,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2952
7.

Conference Proceedings
Conference Proceedings
7. Electrical tagging of cement composites for nondestructive integrity monitoring
Reza,F. ; Batson,G.B. ; Yamamuro,J.A. ; Lee,J.S.
Pub. info.: Nondestructive Evaluation of Materials and Composites II.  pp.196-206,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3396
8.

Conference Proceedings
Conference Proceedings
8. Effect of monitor luminance on the detection of a solitary pulmonary nodule:ROC analysis
Song,K.-S. ; Lee,J.S. ; Kim,H.Y. ; Lim,T.-H.
Pub. info.: Medical Imaging 1999: Image Perception and Performance.  pp.212-216,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3663