1.

Conference Proceedings
Conference Proceedings
1. Die Bonding Issues on Silicon Carbide Diodes
Lee, S.Y. ; Lee, J.S. ; Kim, T.H. ; Choi, S.Y. ; Kim, H.J. ; Bahng, W. ; Kim, N.K. ; Lee, S.K.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.875-878,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Three-Body Microcontact Model of Rough Surfaces and Its Application on Polishing of Wafer
Horng, J.H. ; Lee, J.S. ; Du, D.C.
Pub. info.: Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005.  pp.445-450,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 505-507
3.

Conference Proceedings
Conference Proceedings
3. III-N Based Dilute Magnetic Semiconductors for Spintronics Applications*
Park, Y.D. ; Lee, J.S. ; Lee, S.-Y. ; Khim, Z.G. ; Oh, E. ; Thaler, G.T. ; Overberg, M.E. ; Abernathy, C.R. ; Pearton, S.J. ; Kim, J.-H ; Ren, F.
Pub. info.: State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia.  pp.22-27,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-3
4.

Conference Proceedings
Conference Proceedings
4. Combination of Rigorously Controlled Crevice Geometry and Computational Modeling for the Study of Crevice Corrosion Scaling Factors
Lee, J.S. ; Reed, M.L. ; Kelly, R.G.
Pub. info.: Corrosion and corrosion protection : proceedings of the international symposium.  pp.279-290,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-22
5.

Conference Proceedings
Conference Proceedings
5. Anomalous Hall Effect in Wide Bandgap Diluted Magnetic Semiconductors Co-Doped With Non-Magnetic Impurities
Park, Y.D. ; Choi, H.K. ; Shim, S.B. ; Suh, K.S. ; Seo, S.S.A. ; Noh, T. W. ; SKim, Y. ; Lee, J.S. ; Khim, Z.G. ; Abernathy, C.R. ; Pearton, S.J. ; Zavada, J.M.
Pub. info.: State-of-the-art program on compound semiconductors XLI and nitride and wide bandgap semiconductors for sensors, photonics, and electronics V : proceedings of the international symposia.  pp.300-311,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-06
6.

Conference Proceedings
Conference Proceedings
6. Effects of Composition and Layer Thickness on the Magnetic and Structural Characteristics of GaMnN *
Thaler, G.T. ; Overberg, M. ; Frazier, R. ; Abernathy, C.R. ; Pearton, S.J. ; Ren, F. ; Park, Y.D. ; Rairigh, R. ; Kelly, J. ; Lee, J.S. ; Theodoropoulou, N. ; Hebard, A.F.
Pub. info.: State-of-the-art program on compound semiconductors XXXVIII and wide bandgap semiconductors for photonic and electronic devices and sensors III : proceedings of the international symposia.  pp.141-145,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-4
7.

Conference Proceedings
Conference Proceedings
7. The measurement of elastic waves in a nonferromagnetic plate by a patch-type magnetostrictive sensor
Cho, S.H. ; Sun, K.H. ; Lee, J.S. ; Kim, Y.Y.
Pub. info.: Smart structures and materials 2004 : smart sensor technology and measurement systems : 15-17 March 2004, San Diego, California, USA.  pp.120-130,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5384
8.

Conference Proceedings
Conference Proceedings
8. Deformation Behavior and Microstructure Evolutions in Ti-6Al-4V Extrusion
Park, N.K. ; Yeom, J.T. ; Na, Y.S. ; Lee, J.S. ; Shim, I.O. ; Hong, S.S.
Pub. info.: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.719-724,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 426-432
9.

Conference Proceedings
Conference Proceedings
9. Proton radiation damage in high-resistivity n-type silicon CCDs
Bebek, C.J. ; Groom, D.E. ; Holland, S.E. ; Karcher, A. ; Kolbe, W.F. ; Lee, J.S. ; Levi, M.E. ; Palaio, N.P. ; Turko, B.T. ; Uslenghi, M.C. ; Wagner, M.T. ; Wang, G.
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA.  pp.161-171,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4669
10.

Conference Proceedings
Conference Proceedings
10. The Possibility for Making Large-Sized Bulk Al-Based Composites through Dynamic Compaction Using Water as Pressure Transmitting Medium
Hokamoto, K. ; Lee, J.S. ; Mori, A. ; Tanaka, S.
Pub. info.: Explosion, shock wave and hypervelocity phenomena in materials : proceedings of the 1st International Symposium on Explosion, Shock Wave and Hypervelocity Phenomena in Materials(ESHP Symposium), 15-17 March 2004, Kumamoto, Japan.  pp.313-318,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 465-466