1.

Conference Proceedings
Conference Proceedings
1. Use of DOE for Designing Formulations for Direct Injection Foams
Duever, T. A. ; Mahabir, C. ; Janiczak, R. ; Lee, J. ; Rossignoli, P.
Pub. info.: Conference proceedings at ANTEC '98 : plastics on my mind, Society of Plastics Engineers, Atlanta, Georgia, April 26-April 30, 1998.  3  pp.2986-2990,  1998.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 44(3)
2.

Conference Proceedings
Conference Proceedings
2. Effect of Poly-Si on Electromigration Behaviors and Microstructure Characteristics of Au Metallization
Lee, T. ; York, B. R. ; Lindgren, B. ; Kentzinger, H. ; Lee, J. ; Christenson, C. ; Varker, C. ; Evans, K.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.299-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
3.

Conference Proceedings
Conference Proceedings
3. The Stress Change in Passivated Al Lines Due to the Reaction Between Ti and Al
Marieb, T. ; Mack, A. ; Lee, J. ; DiBattista, M.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.213-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
4.

Conference Proceedings
Conference Proceedings
4. Deuterium Sintering of CMOS Technology for Improved Hot Carrier Reliability
Lee, J. ; Chen, Z. ; Hess, K. ; Lyding, J. W.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.301-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
5.

Conference Proceedings
Conference Proceedings
5. Microstructure Evolution of Al-1.5% Cu Alloy as a Function of Resistance Change Due to Isothermal DC Stressing
Lee, T. ; Schade, M. ; Merino, A. ; Lee, J. ; Christenson, C. ; Varker, C. ; Evans, K.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.109-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516