Color imaging IX : processing, hardcopy, and applications : 20-22 January 2004, San Jose, California, USA. pp.306-313, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lee, E.-H. ; Lee, S. G. ; O, B. H. ; Park, S. G. ; Kim, K. H. ; Kong, J. K. ; Chin, I. ; Kwon, Y. K. ; Choi, Y. W.
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Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II. pp.102-113, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering