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23 results

Conference Proceedings

1. In Situ Growth-Stress Measurement of Cr2O3 Scale Formed on Stainless Steels by Raman Spectroscopy

Kitamura, K. ; Nishiyama, Y. ; Otsuka, N. ; Kudo, T.

Pub. info.:	High-temperature oxidation and corrosion 2005 : proceedings of the International Symposium on High-Temperature Oxidation and Corrosion 2005 , Nara, Japan, 30th November - 2nd December 2005. pp.489-496, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	522-523

Conference Proceedings

2. Strongly (111) oriented metallization by ion plating method

Kudo, T. ; Sakuragi, S. ; Masui, S. ; Kinoshita, K. ; Makino, H. ; Tanaka, M.

Pub. info.:	New methods, mechanisms and models of vapor deposition : symposium held April 24-26, 2000, San Francisco, California, U.S.A.. pp.205-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	616

Conference Proceedings

3. Stability issues in the use of coherent x-rays

Nishino, Y. ; Kudo, T. ; Suzuki, M. ; Ishikawa, T.

Pub. info.:	Crystals, multilayers, and other synchrotron optics : 5 August 2003, San Diego, California, USA. pp.94-103, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5195

Conference Proceedings

4. 60-nm gate length SOI CMOS technology optimised for 'System-on-a-SOI-chip' solution

Imai, K. ; Maruyama, S. ; Suzuld, T. ; Kudo, T. ; Miyake, S. ; Ikeda, M. ; Abe, T. ; Masuda, S. ; Tanabe, A. ; Lee, J-W. ; Shibahara, K. ; Yokoyania, S. ; Qoka, H.

Pub. info.:	Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.149-158, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-5

Conference Proceedings

5. Recent Advances in Lithium-Based Complex Hydrides for Solid-State Hydrogen Storage

Nakamori, Y. ; Kitahara, G. ; Kudo, T. ; Yamagishi, T. ; Orimo, S.

Pub. info.:	PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.2431-2436, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	475-479(3)

Conference Proceedings

6. 60-nm Gate Length SOI CMOS Technology Optimized for 'System-on-a- SOI-Chip' Solution*

Imai, K. ; Maruyama, S. ; Suzuki, T. ; Kudo, T. ; Miyake, S. ; Ikeda, M. ; Abe, T. ; Masuda, S. ; Tanabe, A. ; Lee, J.-W. ; Shibahara, K. ; Yokoyama, S. ; Ooka, H.

Pub. info.:	ULSI Process Integration : proceedings of the International Symposium. pp.493-502, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-6

Conference Proceedings

7. Phase transition and control of self-assembled mesostructured vanadia/surfactant composites

Honma, I. ; Yagi, Y. ; Zhou, H. S. ; Endo, A. ; Miyayama, M. ; Kudo, T.

Pub. info.:	Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.429-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	581

Conference Proceedings

8. Three-dimensional interactive processor which processes 64 directional images

Kudo, T. ; Takaki, Y.

Pub. info.:	Three-Dimensional TV, Video, and Display III. pp.16-23, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5599

Conference Proceedings

9. Study of the effect of amine additives on LWR and LER [6153-44]

Houlihan, F. M. ; Rentkiewicz, D. ; Lin, G. ; Rahman, D. ; Mackenzie, D. ; Timko, A. ; Kudo, T. ; Anyadiegwu, C. ; Thiyagarajan, M. ; Chiu, S. ; Romano, A. ; Dammel, R. R. ; Padmanaban, M.

Pub. info.:	Advances in Resist Technology and Processing XXIII. pp.615317-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6153

10.

Conference Proceedings

10. Versatility in lithographic performance of advanced 193 nm contact hole resist [6153-86]

Kudo, T. ; Lin, G. ; Lee, D. ; Rahman, D. ; Timko, A. ; Mckenzie, D. ; Anyadiegwu, C. ; Chiu, S. ; Houlihan, F. ; Rentkiewicz, D. ; Dammel, R. R. ; Padmanaban, M. ; Biafore, J.

Pub. info.:	Advances in Resist Technology and Processing XXIII. pp.61532C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6153

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