1.

Conference Proceedings
Conference Proceedings
1. Interfacial Condition of Nanoporous TiO2 Electrode and Charge Transport in Dye-Sensitized Solar Cells
Yanagida, S. ; Nakade, S. ; Kanzaki, T. ; Kitamura, T. ; Wada, Y.
Pub. info.: Electron transfer in nanomaterials : proceedings of the International Symposium.  pp.112-117,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-22
2.

Conference Proceedings
Conference Proceedings
2. Defect inspection for imprint lithography using a die to database electron beam verification system [6151-22]
Myron, L. J ; Thompson ; McMackin, I. ; Resnick, D. J. ; Kitamura, T. ; Hasebe, T ; Nakazawa, S ; Tokumoto, T. ; Ainley, E. ; Nordquist, K ; Dauksher, W. J.
Pub. info.: Emerging Lithographic Technologies X.  pp.61510M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6151
3.

Conference Proceedings
Conference Proceedings
3. Introduction of a die-to-database verification tool for mask geometry NGR4000 [6349-150]
Hoffman, M. J. ; Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Nakazawa, S. ; Tokumoto, T. ; Tsuneoka, M. ; Yamamoto, M. ; lnoue, M.
Pub. info.: Photomask Technology 2006.  pp.634940-634940,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349