1.

Conference Proceedings
Conference Proceedings
1. Ideal Strength of Nano-Components
Kitamura, T. ; Umeno, Y. ; Kushima, A.
Pub. info.: Materials structure & micromechanics of fracture IV : MSMF-4 : proceedings of the fourth International Conference on Materials Structure & Micromechanics of Fracture, Brno, Czech Republic, June 23-25, 2004.  pp.25-32,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 482
2.

Conference Proceedings
Conference Proceedings
2. Introduction of a die-to-database verification tool for the entire printed geometry of a die: geometry verification system NGR2100 for DFM
Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Sakai, F. ; Nakazawa, S. ; Vohra, N. ; Yamamoto, M. ; Inoue, M.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.73-84,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
3.

Conference Proceedings
Conference Proceedings
3. Criterion of Mechanical Instability in Inhomogeneous Atomic System
Umeno, Y. ; Kitamura, T.
Pub. info.: Materials structure & micromechanics of fracture IV : MSMF-4 : proceedings of the fourth International Conference on Materials Structure & Micromechanics of Fracture, Brno, Czech Republic, June 23-25, 2004.  pp.127-130,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 482
4.

Conference Proceedings
Conference Proceedings
4. Introduction of a die-to-database verification tool for the entire printed geometry of a die: geometry verification system NGR2100 for DFM [5853-88]
Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Sakai, F. ; Nakazawa, S. ; Vohra, N. ; Yamamoto, M. ; Inoue, M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.988-999,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853