1.

Conference Proceedings
Conference Proceedings
1. Binary phase-based optical encryption system using interferometer
Seo, D.-H. ; Shin, C.-M. ; Kim, J.-Y. ; Kim, C.-S. ; Kim, J.-W. ; Kim, S.-J.
Pub. info.: Optical pattern recognition XIII : 2 April, 2002, Orlando, USA.  pp.82-89,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4734
2.

Conference Proceedings
Conference Proceedings
2. In Situ Deformation Behavior of Retained Austenite in TRIP Steel
Park, K.K. ; Oh, S.T. ; Baeck, S.M. ; Kim, D.-I. ; Han, J.H. ; Han, H.N. ; Park, S.-H. ; Lee, C.G. ; Kim, S.-J. ; Oh, K.H.
Pub. info.: Textures of materials : ICOTOM 13 : proceedings of the 13th International Conference on Textures of Materials, Seoul, Korea, August 26-30, 2002.  pp.571-576,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 408-412
3.

Technical Paper
Technical Paper
3. Multi-Point Nose Shape optimization of Space Launcher Using Response Surface Method.
Lee, J.-W. ; Min, B.-Y. ; Byun, Y.-H. ; Kim, S.-J.
Pub. info.: AIAA paper.  2002.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2002
4.

Conference Proceedings
Conference Proceedings
4. Novel approach for high resolution using cycloolefin-alt-maleic acid derivatives polymer for ArF lithography
Lee, J.-B. ; Park, J.-H. ; Seo, D.-C. ; Kim, C.-M. ; Lim, Y.-T. ; Cho, S.-D. ; Joo, H.-S. ; Jeon, H.-P. ; Kim, S.-J.
Pub. info.: Advances in Resist Technology and Processing XIX.  Part Two  pp.623-630,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4690
5.

Conference Proceedings
Conference Proceedings
5. New approach for 193-nm resist using modified cycloolefin resin
Park, J.H. ; Seo, D.C. ; Kim, C.-M. ; Lim, Y.-T. ; Cho, S.-D. ; Lee, J.B. ; Joo,H.-S. ; Jeon, H.-P. ; Kim, S.-J. ; Jung, J.-C. ; Shin, K.-S. ; Kong, K.K. ; Yamada, T.
Pub. info.: Advances in Resist Technology and Processing XIX.  Part One  pp.120-126,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4690